Grants and Contracts per year
UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. Our work contributes towards the following SDG(s):
Fingerprint
Dive into the research topics where Electron Microscopy Center is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.
Collaborations and top research areas from the last five years
Recent external collaboration from the last 5 years on country level. Dive into details by clicking on the dots.
Profiles
-
John Balk, Ph.D.
- Chemical and Materials Engineering - Professor, Director of Graduate Certificate, Advanced Materials Characterization
- College of Engineering - Associate Dean for Research and Graduate Studies, Director of Graduate Studies, Master of Engineering, W.T. BRYAN PROFESSORSHIP IN MATERIALS ENGINEERING
- Electron Microscopy Center - Director, Electron Microscopy Facility
- Energy Research Priority Area
Person
Grants and Contracts
- 1 Finished
-
Development of Near Edge Energy Loss Structure Acquisition Analysis and other TEM-base Methodologies Related to Semiconductor Characterization
Dozier, A.
3/18/04 → 3/31/10
Project: Research project
Research output
-
Evaluation of Equiatomic CrMnFeCoNiCu System and Subsequent Derivation of a Non-Equiatomic MnFeCoNiCu Alloy
Ter-Isahakyan, A. & Balk, T. J., Mar 2023, In: Materials. 16, 6, 2455.Research output: Contribution to journal › Article › peer-review
Open Access -
High-temperature contact potential difference measurement of surface work function using in vacuo Kelvin probe
Mántica, A. M., Detisch, M. J. & Balk, T. J., Sep 2023, In: Vacuum. 215, 112169.Research output: Contribution to journal › Article › peer-review
-
Observation of Ultrathin Sc-Containing Surface Layer on Life-Tested Scandate Cathodes
Liu, X., Vancil, B. K., Durham, D. B., Ogletree, D. F., Barnard, E. S. & Balk, T. J., Jun 1 2023, In: IEEE Transactions on Electron Devices. 70, 6, p. 2876-2882 7 p.Research output: Contribution to journal › Article › peer-review