Projects and Grants per year
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Dive into the research topics where Electron Microscopy Center is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.
Collaborations and top research areas from the last five years
Recent external collaboration from the last 5 years on country level. Dive into details by clicking on the dots.
Profiles
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John Balk, Ph.D.
- Chemical and Materials Engineering - Professor, Director of Graduate Certificate, Advanced Materials Characterization
- Electron Microscopy Center - Director, Electron Microscopy Facility
- Stanley and Karen Pigman College of Engineering - Associate Dean for Research and Graduate Studies, Director of Graduate Studies, Master of Engineering, W.T. BRYAN PROFESSORSHIP IN MATERIALS ENGINEERING
- Energy Research Priority Area
- Materials Science Research Priority Initiative - Director
Person
Grants and Contracts
- 1 Finished
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Development of Near Edge Energy Loss Structure Acquisition Analysis and other TEM-base Methodologies Related to Semiconductor Characterization
Dozier, A. (PI)
3/18/04 → 3/31/10
Project: Research project
Research output
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Crystallographic faceting of bulk tungsten surfaces observed during in situ heating in an environmental scanning electron microscope
Bai, H., Briot, N. J., Beck, M. J. & Balk, T. J., Jun 2024, In: Materials Characterization. 212, 113925.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Growth and Faceting of Tungsten and Oxides in Scandate Cathode Particles during In Situ Heating in the Scanning Electron Microscope
Bai, H. & Balk, T. J., Oct 2024, In: Crystals. 14, 10, 840.Research output: Contribution to journal › Article › peer-review
Open Access -
Heated-Stage Small-Angle X-Ray Scattering for Quantification of Precipitate Fields and Their Evolution During Process Simulation of AA7050
Stubbers, A. & Balk, T. J., 2024, (Accepted/In press) In: Metals and Materials International.Research output: Contribution to journal › Article › peer-review