Projects and Grants per year
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Dive into the research topics where Electron Microscopy Center is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.
Collaborations and top research areas from the last five years
Recent external collaboration from the last 5 years on country level. Dive into details by clicking on the dots.
Profiles
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John Balk, Ph.D.
- Chemical and Materials Engineering - Professor, W.T. BRYAN PROFESSORSHIP IN MATERIALS ENGINEERING
- Electron Microscopy Center - Director, Electron Microscopy Facility
- Office of the Vice President for Research - Associate Vice President for Research Development and Support
- Energy Research Priority Area
- Materials Science Research Priority Initiative - Director
Person
Grants and Contracts
- 1 Finished
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Development of Near Edge Energy Loss Structure Acquisition Analysis and other TEM-base Methodologies Related to Semiconductor Characterization
Dozier, A. (PI)
3/18/04 → 3/31/10
Project: Research project
Research output
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Effects of metallographic preparation methods on surface quality and electron backscatter diffraction analysis of a dual-phase WMoFeNi multi-principal element alloy
Allamon, A. N. & Balk, T. J., Sep 2025, In: Materials Characterization. 227, 115225.Research output: Contribution to journal › Article › peer-review
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Enhancing intrinsic ductility in VNbMoTaW high entropy alloy: A combinatorial investigation with experimental evaluation of theoretical predictions
Tuhser, T. B. N., Winter, I. S., Chrzan, D. & Balk, T. J., Mar 1 2025, In: Journal of Materials Research and Technology. 35, p. 3645-3654 10 p.Research output: Contribution to journal › Article › peer-review
Open Access2 Scopus citations -
Heated-Stage Small-Angle X-Ray Scattering for Quantification of Precipitate Fields and Their Evolution During Process Simulation of AA7050
Stubbers, A. & Balk, T. J., Feb 2025, In: Metals and Materials International. 31, 2, p. 537-551 15 p.Research output: Contribution to journal › Article › peer-review