Skip to main navigation
Skip to search
Skip to main content
University of Kentucky Home
LOGIN & Help
Home
Research units
Researchers
Projects & Grants
Research Output
Facilities & Equipment
Honors & Awards
Activities
Search by expertise, name or affiliation
CAREER: Fundamental Reliability Physics of MOS Devices Based on Deuterium Isotope Effects
Chen, Zhi
(PI)
Electrical and Computer Engineering
Overview
Fingerprint
Projects & Grants
(2)
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering
Integrated Circuit
100%
Secondary Schools
100%
School Student
100%
Hot Electron
66%
Energetics
66%
Seniors
33%
Competing Process
33%
Dynamic Stress
33%
Semiconductor Device
33%
Degradation Mechanism
33%
Si Interface
33%
Microelectronics
33%
Carrier Lifetime
33%
Electrical Engineering
33%
Research Work
33%
Silicon Dioxide
33%
Inverter
33%
Digital Circuits
33%
Material Science
Transistor
100%
Deuterium
100%
Electronic Circuit
62%
Hot Electron
25%
Device Fabrication
25%
Hot Carrier
25%
Carrier Lifetime
12%
Raman Spectroscopy
12%
Semiconductor Device
12%
Hydrogen Bonding
12%