Engineering
Fabrication
100%
Microsystem
100%
Critical Micelle Concentration
100%
Multiscale
66%
Performance
50%
Electron Optical Lithography
33%
Prototype
33%
Operating Speed
16%
Silicon Photonics
16%
Resonator
16%
Behavioral Model
16%
Data Rate
16%
Speed Data
16%
Electric Power Utilization
16%
Testing
16%
Sectional Dimension
16%
Design Parameter
16%
Semiconductor Fabrication
16%
Commercial Feasibility
16%
Research
16%
Radii
16%
Computer Science
Neural Network
100%
Computing
100%
Procedure
75%
Performance Bound
50%
Silicon Photonics
25%
Operating Speed
25%
Model
25%
Physical Design
25%
Planned Activity
25%
Power Consumption
25%
Testing
25%
Design Parameter
25%
Reporting Period
25%
Verilog
25%
Semiconductor Material
25%
Standard
25%
Material Science
Critical Micelle Concentration
100%
Devices
83%
Silicon
33%
Lithography
33%
Semiconductor Material
16%
Characterization
16%
Resonator
16%