Abstract
This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.
| Original language | English |
|---|---|
| Title of host publication | Emerging Digital Micromirror Device Based Systems and Applications XI |
| Editors | Michael R. Douglass, John Ehmke, Benjamin L. Lee |
| ISBN (Electronic) | 9781510625068 |
| DOIs | |
| State | Published - 2019 |
| Event | Emerging Digital Micromirror Device Based Systems and Applications XI 2019 - San Francisco, United States Duration: Feb 5 2019 → Feb 6 2019 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 10932 |
| ISSN (Print) | 0277-786X |
| ISSN (Electronic) | 1996-756X |
Conference
| Conference | Emerging Digital Micromirror Device Based Systems and Applications XI 2019 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 2/5/19 → 2/6/19 |
Bibliographical note
Publisher Copyright:© 2019 SPIE.
Keywords
- Dual-projector
- Phase measuring profilometry
- Phase unwrapping
- Structured light illumination
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering