3D scanning by means of dual-projector structured light illumination

Ying Yu; Daniel L. Lau; Matthew P. Ruffner

doi:10.1117/12.2510990

3D scanning by means of dual-projector structured light illumination

Ying Yu, Daniel L. Lau, Matthew P. Ruffner

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.

Original language	English
Title of host publication	Emerging Digital Micromirror Device Based Systems and Applications XI
Editors	Michael R. Douglass, John Ehmke, Benjamin L. Lee
ISBN (Electronic)	9781510625068
DOIs	https://doi.org/10.1117/12.2510990
State	Published - 2019
Event	Emerging Digital Micromirror Device Based Systems and Applications XI 2019 - San Francisco, United States Duration: Feb 5 2019 → Feb 6 2019

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	10932
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Emerging Digital Micromirror Device Based Systems and Applications XI 2019
Country/Territory	United States
City	San Francisco
Period	2/5/19 → 2/6/19

Bibliographical note

Funding Information:
This work has been supported by Intel Corporation and the National Science Foundation under contract No. 1539157 and the Visual and Experiential Computing initiative. Dr. Daniel L. Lau is a Professor at the University of Kentucky and a Founder of Seikowave Inc., a private company that designs and sells structured light scanners.

Keywords

Dual-projector
Phase measuring profilometry
Phase unwrapping
Structured light illumination

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2510990

Cite this

Yu, Y., Lau, D. L., & Ruffner, M. P. (2019). 3D scanning by means of dual-projector structured light illumination. In M. R. Douglass, J. Ehmke, & B. L. Lee (Eds.), Emerging Digital Micromirror Device Based Systems and Applications XI Article 109320M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10932). https://doi.org/10.1117/12.2510990

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abstract = "This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.",

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author = "Ying Yu and Lau, {Daniel L.} and Ruffner, {Matthew P.}",

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Yu, Y, Lau, DL & Ruffner, MP 2019, 3D scanning by means of dual-projector structured light illumination. in MR Douglass, J Ehmke & BL Lee (eds), Emerging Digital Micromirror Device Based Systems and Applications XI., 109320M, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10932, Emerging Digital Micromirror Device Based Systems and Applications XI 2019, San Francisco, United States, 2/5/19. https://doi.org/10.1117/12.2510990

3D scanning by means of dual-projector structured light illumination. / Yu, Ying; Lau, Daniel L.; Ruffner, Matthew P.
Emerging Digital Micromirror Device Based Systems and Applications XI. ed. / Michael R. Douglass; John Ehmke; Benjamin L. Lee. 2019. 109320M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10932).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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3D scanning by means of dual-projector structured light illumination

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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