Abstract
This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.
Original language | English |
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Title of host publication | Emerging Digital Micromirror Device Based Systems and Applications XI |
Editors | Michael R. Douglass, John Ehmke, Benjamin L. Lee |
ISBN (Electronic) | 9781510625068 |
DOIs | |
State | Published - 2019 |
Event | Emerging Digital Micromirror Device Based Systems and Applications XI 2019 - San Francisco, United States Duration: Feb 5 2019 → Feb 6 2019 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 10932 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Emerging Digital Micromirror Device Based Systems and Applications XI 2019 |
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Country/Territory | United States |
City | San Francisco |
Period | 2/5/19 → 2/6/19 |
Bibliographical note
Publisher Copyright:© 2019 SPIE.
Funding
This work has been supported by Intel Corporation and the National Science Foundation under contract No. 1539157 and the Visual and Experiential Computing initiative. Dr. Daniel L. Lau is a Professor at the University of Kentucky and a Founder of Seikowave Inc., a private company that designs and sells structured light scanners.
Funders | Funder number |
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National Science Foundation (NSF) | 1539157 |
Intel Corporation |
Keywords
- Dual-projector
- Phase measuring profilometry
- Phase unwrapping
- Structured light illumination
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering