3D scanning by means of dual-projector structured light illumination

Ying Yu, Daniel L. Lau, Matthew P. Ruffner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations


This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.

Original languageEnglish
Title of host publicationEmerging Digital Micromirror Device Based Systems and Applications XI
EditorsMichael R. Douglass, John Ehmke, Benjamin L. Lee
ISBN (Electronic)9781510625068
StatePublished - 2019
EventEmerging Digital Micromirror Device Based Systems and Applications XI 2019 - San Francisco, United States
Duration: Feb 5 2019Feb 6 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceEmerging Digital Micromirror Device Based Systems and Applications XI 2019
Country/TerritoryUnited States
CitySan Francisco

Bibliographical note

Funding Information:
This work has been supported by Intel Corporation and the National Science Foundation under contract No. 1539157 and the Visual and Experiential Computing initiative. Dr. Daniel L. Lau is a Professor at the University of Kentucky and a Founder of Seikowave Inc., a private company that designs and sells structured light scanners.


  • Dual-projector
  • Phase measuring profilometry
  • Phase unwrapping
  • Structured light illumination

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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