3D scanning by means of dual-projector structured light illumination

Ying Yu, Daniel L. Lau, Matthew P. Ruffner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.

Original languageEnglish
Title of host publicationEmerging Digital Micromirror Device Based Systems and Applications XI
EditorsMichael R. Douglass, John Ehmke, Benjamin L. Lee
ISBN (Electronic)9781510625068
DOIs
StatePublished - 2019
EventEmerging Digital Micromirror Device Based Systems and Applications XI 2019 - San Francisco, United States
Duration: Feb 5 2019Feb 6 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10932
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceEmerging Digital Micromirror Device Based Systems and Applications XI 2019
Country/TerritoryUnited States
CitySan Francisco
Period2/5/192/6/19

Bibliographical note

Publisher Copyright:
© 2019 SPIE.

Funding

This work has been supported by Intel Corporation and the National Science Foundation under contract No. 1539157 and the Visual and Experiential Computing initiative. Dr. Daniel L. Lau is a Professor at the University of Kentucky and a Founder of Seikowave Inc., a private company that designs and sells structured light scanners.

FundersFunder number
National Science Foundation (NSF)1539157
Intel Corporation

    Keywords

    • Dual-projector
    • Phase measuring profilometry
    • Phase unwrapping
    • Structured light illumination

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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