This paper considers the application of neural networks for detecting defects in materials consisting of dense micro-structures using ultrasonic pulse-echo systems. The motivation for this work is the desire to detect defects modeled by small complex scattering centers. To preserve signal features useful for defect detection, minimal preprocessing is performed on the data presented to the neural network. This paper describes modifications to the typical feed-forward multi-layer perceptron architecture for direct application to sampled RF ultrasonic A-scans.
|Number of pages||4|
|Journal||Proceedings - IEEE Ultrasonics Symposium|
|State||Published - 1991|
|Event||1991 IEEE Ultrasonics Symposium. ULTSYM 1991 - Orlando, United States|
Duration: Dec 8 1991 → Dec 11 1991
Bibliographical noteFunding Information:
This work was partially supported by SDIO/IST managed by the Office of Naval Research under Contract No. N00014-86-K-0520 and by the National Science Foundation under Grant No. MIP-8920602.
© 1991 IEEE.
ASJC Scopus subject areas
- Acoustics and Ultrasonics