A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials

Alex M. Boehm; Jochen Wieser; Kamal Butrouna; Kenneth R. Graham

doi:10.1016/j.orgel.2016.11.032

A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials

Alex M. Boehm, Jochen Wieser, Kamal Butrouna, Kenneth R. Graham

Chemistry

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Accurate measurements of the valence electronic structures of organic semiconductors are important for the development and understanding of organic electronic devices, materials, and interfaces. Ultraviolet photoelectron spectroscopy (UPS) is a well-established technique for probing valence electronic structures; however, many organic semiconductors undergo rapid sample degradation upon exposure to traditional laboratory-based vacuum ultraviolet (VUV) photon sources. Here, we report on a novel VUV photon source for UPS measurements that utilizes H Lyman-α emission with a narrow linewidth and a widely tunable intensity, and apply it to a number of organic materials of interest to show its ability to overcome this hurdle of sample degradation. Furthermore, the H Lyman-α source displays no measureable higher energy emission lines, which significantly reduces the background over typical He I discharge sources and allows for the onset of the density of states to be clearly observed over several orders of magnitude.

Original language	English
Pages (from-to)	9-16
Number of pages	8
Journal	Organic Electronics
Volume	41
DOIs	https://doi.org/10.1016/j.orgel.2016.11.032
State	Published - Feb 1 2017

Bibliographical note

Publisher Copyright:
© 2016 Elsevier B.V.

Funding

We greatly acknowledge Prof. Aram Amassian at KAUST for permitting use of data (NPD He I UPS data) taken during K.R.G.'s time as a post-doctoral researcher in the Amassian group. We also acknowledge Xikang Zhao and Prof. Jianguo Mei of the Department of Chemistry at Purdue University for providing DPP containing polymers. A.M.B., K.B., and K.R.G acknowledge the University of Kentucky for start-up funding.

Funders	Funder number
Department of Chemistry at Purdue University
University of Kentucky

Keywords

Electronic structure
NPD
Organic semiconductor
P3HT
Ultraviolet photoelectron spectroscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Biomaterials
General Chemistry
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

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10.1016/j.orgel.2016.11.032

Cite this

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title = "A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials",

abstract = "Accurate measurements of the valence electronic structures of organic semiconductors are important for the development and understanding of organic electronic devices, materials, and interfaces. Ultraviolet photoelectron spectroscopy (UPS) is a well-established technique for probing valence electronic structures; however, many organic semiconductors undergo rapid sample degradation upon exposure to traditional laboratory-based vacuum ultraviolet (VUV) photon sources. Here, we report on a novel VUV photon source for UPS measurements that utilizes H Lyman-α emission with a narrow linewidth and a widely tunable intensity, and apply it to a number of organic materials of interest to show its ability to overcome this hurdle of sample degradation. Furthermore, the H Lyman-α source displays no measureable higher energy emission lines, which significantly reduces the background over typical He I discharge sources and allows for the onset of the density of states to be clearly observed over several orders of magnitude.",

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AU - Boehm, Alex M.

AU - Wieser, Jochen

AU - Butrouna, Kamal

AU - Graham, Kenneth R.

PY - 2017/2/1

Y1 - 2017/2/1

N2 - Accurate measurements of the valence electronic structures of organic semiconductors are important for the development and understanding of organic electronic devices, materials, and interfaces. Ultraviolet photoelectron spectroscopy (UPS) is a well-established technique for probing valence electronic structures; however, many organic semiconductors undergo rapid sample degradation upon exposure to traditional laboratory-based vacuum ultraviolet (VUV) photon sources. Here, we report on a novel VUV photon source for UPS measurements that utilizes H Lyman-α emission with a narrow linewidth and a widely tunable intensity, and apply it to a number of organic materials of interest to show its ability to overcome this hurdle of sample degradation. Furthermore, the H Lyman-α source displays no measureable higher energy emission lines, which significantly reduces the background over typical He I discharge sources and allows for the onset of the density of states to be clearly observed over several orders of magnitude.

AB - Accurate measurements of the valence electronic structures of organic semiconductors are important for the development and understanding of organic electronic devices, materials, and interfaces. Ultraviolet photoelectron spectroscopy (UPS) is a well-established technique for probing valence electronic structures; however, many organic semiconductors undergo rapid sample degradation upon exposure to traditional laboratory-based vacuum ultraviolet (VUV) photon sources. Here, we report on a novel VUV photon source for UPS measurements that utilizes H Lyman-α emission with a narrow linewidth and a widely tunable intensity, and apply it to a number of organic materials of interest to show its ability to overcome this hurdle of sample degradation. Furthermore, the H Lyman-α source displays no measureable higher energy emission lines, which significantly reduces the background over typical He I discharge sources and allows for the onset of the density of states to be clearly observed over several orders of magnitude.

KW - Electronic structure

KW - NPD

KW - Organic semiconductor

KW - P3HT

KW - Ultraviolet photoelectron spectroscopy

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JO - Organic Electronics

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A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials

Abstract

Bibliographical note

Funding

Keywords

ASJC Scopus subject areas

Access to Document

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