Abstract
In this communication, we report theoretical analysis of the contribution of surface energy to the energy dissipation during the growth of a tin whisker in a tin film. The mass transport of tin for the growth of the tin whisker is grain-boundary diffusion. The surface energy hinders the growth of the tin whisker. There is a threshold of the strain energy stored in the tin film, below which no whiskers of corresponding radius can grow. The strain energy stored in a tin film prior to the formation of a whisker determines the growth time of the whisker if there are no other mechanisms for the dissipation and generation of strain energy.
Original language | English |
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Pages (from-to) | 486-493 |
Number of pages | 8 |
Journal | Philosophical Magazine Letters |
Volume | 100 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2 2020 |
Bibliographical note
Publisher Copyright:© 2020 Informa UK Limited, trading as Taylor & Francis Group.
Keywords
- Tin whisker
- critical strain energy
- grain-boundary diffusion
- surface energy
ASJC Scopus subject areas
- Condensed Matter Physics