Abstract
Numerical simulation is a flexible, practical tool for efficiently investigating machine vision hardware/software configurations for myriad industrial applications and can significantly reduce the engineering time necessary to design and implement a system. In this paper, physically accurate image synthesis is used to investigate the ability of diffuse angle images to detect topographical defects reliably in smooth, highly specular coatings; a specular-plus-diffuse reflectance model provides the Scientific underpinning for this hypothesis. The specific results presented in this study show that diffuse images of topographical defects yield high-contrast grey-scale images compared with diffuse images of similar coatings without topographical defects, facilitating effective defect detection and providing a foundation for characterizing the severity of defects present in a given region.
Original language | English |
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Pages (from-to) | 1073-1079 |
Number of pages | 7 |
Journal | Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture |
Volume | 216 |
Issue number | 7 |
DOIs | |
State | Published - 2002 |
Keywords
- Defect detection
- Image synthesis
- Reflectance model
- Specular surfaces
ASJC Scopus subject areas
- Mechanical Engineering
- Industrial and Manufacturing Engineering