Abstract
We numerically calculated the optical absorption cross section (C abs) of a silver nanoparticle (AgNP) and a gold nanoparticle (AuNP) in the presence of metallic (gold) and dielectric (silicon) atomic force microscope (AFM) probes, illuminated by transverse magnetic polarized, total internally reflected waves. Both nanoscale probes localize and enhance the field between the apex of the tip and the particle. However, the absorption of the nanoparticle is not always enhanced. Fitting the numerical absorption data to a driven damped harmonic oscillator model revealed that the AFM tip modifies both the driving force (F0), consisting of the free carrier charge and the driving field, and the overall damping of the oscillator (β). These effects can be complementary or competing, and they combine to either enhance or suppress absorption. Therefore, under an Si tip, Cabs of a AuNP is enhanced while Cabs of a AgNP is suppressed. In contrast, an Au tip suppresses the absorption cross section for both Au and Ag NPs.
Original language | English |
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Article number | 6425396 |
Journal | IEEE Journal of Selected Topics in Quantum Electronics |
Volume | 19 |
Issue number | 3 |
DOIs | |
State | Published - 2013 |
Keywords
- Absorption
- atomic force microscopy
- finite element methods
- nanoparticles
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering