An alternative interpretation of hot electron interface degradation in NMOSFET's: Isotope results irreconcilable with major defect generation by holes?
- Karl Hess
- , Jinju Lee
- , Zhi Chen
- , Joseph W. Lyding
- , Young Kwang Kim
- , Bong Seok Kim
- , Yong Hee Lee
- , Young Wug Kim
- , Kwang Pyuk Suh
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations