Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders

Xiaotao Liu, Qunfei Zhou, Tyler Maxwell, Matthew J. Beck, T. John Balk, Bernard Vancil

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Highly faceted tungsten grains were observed experimentally on the surfaces of two scandate cathodes that had been prepared from L-S and L-L powders. Using Wulff analysis, the facets were identified as {100}, {110} and {112} crystallographic planes, and the {112} facets dominated with respect to surface area. The effect of these facets on cathode emission properties is discussed in terms of their influence on work function and also values of the fitting parameter in the Richardson-Dushman equation J=3DAT2exp(-φ/kT).

Original languageEnglish
Title of host publication2018 IEEE International Vacuum Electronics Conference, IVEC 2018
Pages323-324
Number of pages2
ISBN (Electronic)9781538604540
DOIs
StatePublished - Jun 20 2018
Event19th IEEE International Vacuum Electronics Conference, IVEC 2018 - Monterey, United States
Duration: Apr 23 2018Apr 26 2018

Publication series

Name2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Conference

Conference19th IEEE International Vacuum Electronics Conference, IVEC 2018
Country/TerritoryUnited States
CityMonterey
Period4/23/184/26/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • Wulff construction
  • emission properties
  • facet
  • scandate cathode

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Instrumentation

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