Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders

Xiaotao Liu; Qunfei Zhou; Tyler Maxwell; Matthew J. Beck; T. John Balk; Bernard Vancil

doi:10.1109/IVEC.2018.8391507

Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders

Xiaotao Liu, Qunfei Zhou, Tyler Maxwell, Matthew J. Beck, T. John Balk, Bernard Vancil

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Highly faceted tungsten grains were observed experimentally on the surfaces of two scandate cathodes that had been prepared from L-S and L-L powders. Using Wulff analysis, the facets were identified as {100}, {110} and {112} crystallographic planes, and the {112} facets dominated with respect to surface area. The effect of these facets on cathode emission properties is discussed in terms of their influence on work function and also values of the fitting parameter in the Richardson-Dushman equation J=3DAT²exp(-φ/kT).

Original language	English
Title of host publication	2018 IEEE International Vacuum Electronics Conference, IVEC 2018
Pages	323-324
Number of pages	2
ISBN (Electronic)	9781538604540
DOIs	https://doi.org/10.1109/IVEC.2018.8391507
State	Published - Jun 20 2018
Event	19th IEEE International Vacuum Electronics Conference, IVEC 2018 - Monterey, United States Duration: Apr 23 2018 → Apr 26 2018

Publication series

Name	2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Conference

Conference	19th IEEE International Vacuum Electronics Conference, IVEC 2018
Country/Territory	United States
City	Monterey
Period	4/23/18 → 4/26/18

Bibliographical note

Funding Information:
This work was financially supported by the Defense Advanced Research Projects Agency (DARPA) Innovative Vacuum Electronics Science and Technology (INVEST) program, under grant number N66001-16-1-4041.

Publisher Copyright:
© 2018 IEEE.

Keywords

Wulff construction
emission properties
facet
scandate cathode

ASJC Scopus subject areas

Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/IVEC.2018.8391507

Cite this

Liu, X., Zhou, Q., Maxwell, T., Beck, M. J., John Balk, T., & Vancil, B. (2018). Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders. In 2018 IEEE International Vacuum Electronics Conference, IVEC 2018 (pp. 323-324). (2018 IEEE International Vacuum Electronics Conference, IVEC 2018). https://doi.org/10.1109/IVEC.2018.8391507

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abstract = "Highly faceted tungsten grains were observed experimentally on the surfaces of two scandate cathodes that had been prepared from L-S and L-L powders. Using Wulff analysis, the facets were identified as {100}, {110} and {112} crystallographic planes, and the {112} facets dominated with respect to surface area. The effect of these facets on cathode emission properties is discussed in terms of their influence on work function and also values of the fitting parameter in the Richardson-Dushman equation J=3DAT2exp(-φ/kT).",

keywords = "Wulff construction, emission properties, facet, scandate cathode",

author = "Xiaotao Liu and Qunfei Zhou and Tyler Maxwell and Beck, {Matthew J.} and {John Balk}, T. and Bernard Vancil",

note = "Funding Information: This work was financially supported by the Defense Advanced Research Projects Agency (DARPA) Innovative Vacuum Electronics Science and Technology (INVEST) program, under grant number N66001-16-1-4041. Publisher Copyright: {\textcopyright} 2018 IEEE.; null ; Conference date: 23-04-2018 Through 26-04-2018",

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doi = "10.1109/IVEC.2018.8391507",

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Liu, X, Zhou, Q, Maxwell, T, Beck, MJ , John Balk, T & Vancil, B 2018, Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders. in 2018 IEEE International Vacuum Electronics Conference, IVEC 2018. 2018 IEEE International Vacuum Electronics Conference, IVEC 2018, pp. 323-324, 19th IEEE International Vacuum Electronics Conference, IVEC 2018, Monterey, United States, 4/23/18. https://doi.org/10.1109/IVEC.2018.8391507

Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders. / Liu, Xiaotao; Zhou, Qunfei; Maxwell, Tyler et al.

2018 IEEE International Vacuum Electronics Conference, IVEC 2018. 2018. p. 323-324 (2018 IEEE International Vacuum Electronics Conference, IVEC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Beck, Matthew J.

AU - John Balk, T.

AU - Vancil, Bernard

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N2 - Highly faceted tungsten grains were observed experimentally on the surfaces of two scandate cathodes that had been prepared from L-S and L-L powders. Using Wulff analysis, the facets were identified as {100}, {110} and {112} crystallographic planes, and the {112} facets dominated with respect to surface area. The effect of these facets on cathode emission properties is discussed in terms of their influence on work function and also values of the fitting parameter in the Richardson-Dushman equation J=3DAT2exp(-φ/kT).

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Analysis of faceted tungsten grains on the surfaces of scandate cathodes fabricated from L-S and L-L powders

Abstract

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