Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors
- Lee Jinju
- , Kangguo Cheng
- , Zhi Chen
- , Karl Hess
- , Joseph W. Lyding
- , Kim Young-Kwang
- , Lee Seung
- , Kim Young-Wug
- , Suh Kwang-Pyuk
Research output: Contribution to journal › Article › peer-review
45
Scopus
citations