Abstract
Complete removal of cancer tumors with a negative specimen margin during lumpectomy is essential to reduce breast cancer recurrence. However, 2D radiography, the current method used to assess intraoperative specimen margin status, has limited accuracy, resulting in nearly one in four patients needing repeat surgery. This study aims to develop a deep learning model that improves the detection of positive margins in intraoperative breast lumpectomy specimens on radiographs. We annotated the lumpectomy radiograph images with masking that denotes regions of known malignancy, non-malignant tissue, and the areas of pathology-confirmed positive margin. We propose a pretraining strategy, namely Forward-Forward Contrastive Learning (FFCL) with both local and global-level contrastive learning. Experimental results on our annotated breast radiographs demonstrate the effectiveness of our FFCL method in detecting positive margins from intraoperative radiographs of breast lumpectomy specimens.
Original language | English |
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Title of host publication | 17th International Workshop on Breast Imaging, IWBI 2024 |
Editors | Maryellen L. Giger, Heather M. Whitney, Karen Drukker, Hui Li |
ISBN (Electronic) | 9781510680203 |
DOIs | |
State | Published - 2024 |
Event | 17th International Workshop on Breast Imaging, IWBI 2024 - Chicago, United States Duration: Jun 9 2024 → Jun 12 2024 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 13174 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | 17th International Workshop on Breast Imaging, IWBI 2024 |
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Country/Territory | United States |
City | Chicago |
Period | 6/9/24 → 6/12/24 |
Bibliographical note
Publisher Copyright:© 2024 SPIE.
Keywords
- Breast cancer
- Contrastive learning
- Forward-Forward
- Lumpectomy specimen
- Radiography
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering