BaY16Si4O33 containing Ba(SiO4)4 orthosilicates

Shuto Motozawa; Hiromitsu Kimura; Junichi Takahashi; Rayko Simura; Hisanori Yamane; S. Parkin

doi:10.1107/S2056989022011057

BaY16Si4O33 containing Ba(SiO4)4 orthosilicates

Shuto Motozawa, Hiromitsu Kimura, Junichi Takahashi, Rayko Simura, Hisanori Yamane, S. Parkin

Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

Single crystals of a new quaternary oxide, barium hexadecayttrium tetrasilicon tritriacontaoxide, BaY16Si4O33, were obtained from a melt-solidified sample prepared by heating a mixture of BaCO3, Y2O3, and SiO2 at 2073 K. X-ray crystal structure analysis revealed that Ba(SiO4)4 orthosilicate clusters in which a Ba atom is surrounded by four SiO4 tetrahedra were isolated in a framework composed of Y and O in the structure of BaY16Si4O33. The dielectric constant measured for polycrystalline ceramics of BaY16Si4O33 sintered at 1953 K was 13 (298 K, 1 MHz), and the thermal expansion coefficient was 8.70 × 10 -6 K-1 (298-873 K), which are close to the values previously reported for Y2O3.

Original language	English
Pages (from-to)	1249-1252
Number of pages	4
Journal	Acta Crystallographica Section E: Crystallographic Communications
Volume	78
DOIs	https://doi.org/10.1107/S2056989022011057
State	Published - Nov 30 2022

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© 2022 International Union of Crystallography. All rights reserved.

Keywords

barium yttrium silicon oxide
crystal structure
dielectric properties
orthosilicate
thermal expansion

ASJC Scopus subject areas

Chemistry (all)
Materials Science (all)
Condensed Matter Physics

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Cite this

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title = "BaY16Si4O33 containing Ba(SiO4)4 orthosilicates",

abstract = "Single crystals of a new quaternary oxide, barium hexadecayttrium tetrasilicon tritriacontaoxide, BaY16Si4O33, were obtained from a melt-solidified sample prepared by heating a mixture of BaCO3, Y2O3, and SiO2 at 2073 K. X-ray crystal structure analysis revealed that Ba(SiO4)4 orthosilicate clusters in which a Ba atom is surrounded by four SiO4 tetrahedra were isolated in a framework composed of Y and O in the structure of BaY16Si4O33. The dielectric constant measured for polycrystalline ceramics of BaY16Si4O33 sintered at 1953 K was 13 (298 K, 1 MHz), and the thermal expansion coefficient was 8.70 × 10 -6 K-1 (298-873 K), which are close to the values previously reported for Y2O3.",

keywords = "barium yttrium silicon oxide, crystal structure, dielectric properties, orthosilicate, thermal expansion",

author = "Shuto Motozawa and Hiromitsu Kimura and Junichi Takahashi and Rayko Simura and Hisanori Yamane and S. Parkin",

year = "2022",

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doi = "10.1107/S2056989022011057",

language = "English",

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TY - JOUR

T1 - BaY16Si4O33 containing Ba(SiO4)4 orthosilicates

AU - Motozawa, Shuto

AU - Kimura, Hiromitsu

AU - Takahashi, Junichi

AU - Simura, Rayko

AU - Yamane, Hisanori

AU - Parkin, S.

PY - 2022/11/30

Y1 - 2022/11/30

N2 - Single crystals of a new quaternary oxide, barium hexadecayttrium tetrasilicon tritriacontaoxide, BaY16Si4O33, were obtained from a melt-solidified sample prepared by heating a mixture of BaCO3, Y2O3, and SiO2 at 2073 K. X-ray crystal structure analysis revealed that Ba(SiO4)4 orthosilicate clusters in which a Ba atom is surrounded by four SiO4 tetrahedra were isolated in a framework composed of Y and O in the structure of BaY16Si4O33. The dielectric constant measured for polycrystalline ceramics of BaY16Si4O33 sintered at 1953 K was 13 (298 K, 1 MHz), and the thermal expansion coefficient was 8.70 × 10 -6 K-1 (298-873 K), which are close to the values previously reported for Y2O3.

AB - Single crystals of a new quaternary oxide, barium hexadecayttrium tetrasilicon tritriacontaoxide, BaY16Si4O33, were obtained from a melt-solidified sample prepared by heating a mixture of BaCO3, Y2O3, and SiO2 at 2073 K. X-ray crystal structure analysis revealed that Ba(SiO4)4 orthosilicate clusters in which a Ba atom is surrounded by four SiO4 tetrahedra were isolated in a framework composed of Y and O in the structure of BaY16Si4O33. The dielectric constant measured for polycrystalline ceramics of BaY16Si4O33 sintered at 1953 K was 13 (298 K, 1 MHz), and the thermal expansion coefficient was 8.70 × 10 -6 K-1 (298-873 K), which are close to the values previously reported for Y2O3.

KW - barium yttrium silicon oxide

KW - crystal structure

KW - dielectric properties

KW - orthosilicate

KW - thermal expansion

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U2 - 10.1107/S2056989022011057

DO - 10.1107/S2056989022011057

M3 - Article

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SN - 2056-9890

VL - 78

SP - 1249

EP - 1252

JO - Acta Crystallographica Section E: Crystallographic Communications

JF - Acta Crystallographica Section E: Crystallographic Communications

ER -

BaY16Si4O33 containing Ba(SiO4)4 orthosilicates

Abstract

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Keywords

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