BaY16Si4O33 containing Ba(SiO4)4 orthosilicates

Shuto Motozawa, Hiromitsu Kimura, Junichi Takahashi, Rayko Simura, Hisanori Yamane, S. Parkin

Research output: Contribution to journalArticlepeer-review

Abstract

Single crystals of a new quaternary oxide, barium hexadecayttrium tetrasilicon tritriacontaoxide, BaY16Si4O33, were obtained from a melt-solidified sample prepared by heating a mixture of BaCO3, Y2O3, and SiO2 at 2073 K. X-ray crystal structure analysis revealed that Ba(SiO4)4 orthosilicate clusters in which a Ba atom is surrounded by four SiO4 tetrahedra were isolated in a framework composed of Y and O in the structure of BaY16Si4O33. The dielectric constant measured for polycrystalline ceramics of BaY16Si4O33 sintered at 1953 K was 13 (298 K, 1 MHz), and the thermal expansion coefficient was 8.70 × 10 -6 K-1 (298-873 K), which are close to the values previously reported for Y2O3.

Original languageEnglish
Pages (from-to)1249-1252
Number of pages4
JournalActa Crystallographica Section E: Crystallographic Communications
Volume78
DOIs
StatePublished - Nov 30 2022

Bibliographical note

Publisher Copyright:
© 2022 International Union of Crystallography. All rights reserved.

Keywords

  • barium yttrium silicon oxide
  • crystal structure
  • dielectric properties
  • orthosilicate
  • thermal expansion

ASJC Scopus subject areas

  • Chemistry (all)
  • Materials Science (all)
  • Condensed Matter Physics

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