BimodalPS: Causes and Corrections for Bimodal Multi-Path in Phase-Shifting Structured Light Scanners

Structured light illumination is an active 3D scanning technique based on projecting and capturing a set of striped patterns and measuring the warping of the patterns as they reflect off a target object's surface. As designed, each pixel in the camera sees exactly one pixel from the projector; however, there are multi-path situations where a camera pixel sees light from multiple projector positions. In the case of bimodal multi-path, the camera pixel receives light from exactly two positions, which occurs along a step edge where the edge slices through a pixel which, therefore, sees both a foreground and background surface. In this paper, we present a general mathematical model to address this bimodal multi-path issue in a phase-shifting or so-called phase-measuring-profilometry scanner to measure the constructive and destructive interference between the two light paths, and by taking advantage of this interference, separate the paths and make two decoupled depth measurements. We validate our algorithm with both simulations and a number of challenging real-world scenarios, significantly outperforming the state-of-the-art methods.