Causes and corrections for bimodal multi-path scanning with structured light

Yu Zhang, Daniel L. Lau, Ying Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

Structured light illumination is an active 3D scanning technique based on projecting/capturing a set of striped patterns and measuring the warping of the patterns as they reflect off a target object's surface. As designed, each pixel in the camera sees exactly one pixel from the projector; however, there are multi-path situations when the scanned surface has a complicated geometry with step edges and other discontinuities in depth or where the target surface has specularities that reflect light away from the camera. These situations are generally referred to multi-path where a camera pixel sees light from multiple projector positions. In the case of bimodal multi-path, the camera pixel receives light from exactly two positions which occurs along a step edge where the edge slices through a pixel so that the pixel sees both a foreground and background surface. In this paper, we present a general mathematical model to address the bimodal multi-path issue in a phase-measuring-profilometry scanner to measure the constructive and destructive interference between the two light paths, and by taking advantage of this interesting cue, separate the paths and make two decoupled phase measurements. We validate our algorithm with a number of challenging real-world scenarios, outperforming the state-of-the-art method.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019
Pages4426-4434
Number of pages9
ISBN (Electronic)9781728132938
DOIs
StatePublished - Jun 2019
Event32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019 - Long Beach, United States
Duration: Jun 16 2019Jun 20 2019

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2019-June
ISSN (Print)1063-6919

Conference

Conference32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019
Country/TerritoryUnited States
CityLong Beach
Period6/16/196/20/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

  • 3D from Multiview and Sensors
  • RGBD sensors and analytics

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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