Characterization of material phases on the surface and in the near-surface region of scandate cathodes

Xiaotao Liu; Matthew J. Beck; T. John Balk; Bernard K. Vancil

doi:10.1109/IVEC45766.2020.9520556

Characterization of material phases on the surface and in the near-surface region of scandate cathodes

Xiaotao Liu, Matthew J. Beck, T. John Balk, Bernard K. Vancil

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The impressive electron emission capabilities of scandate cathodes continue to receive significant research attention, although there remain gaps in understanding the mechanistic reasons for their performance. This is partly due to lingering questions about the materials and microstructure of the cathode emitting surface. In the current study, scandate cathodes fabricated using related but distinct processes were emission-tested and then characterized using advanced electron microscopy and analytical spectroscopy techniques. The cathode surfaces were consistently observed to consist of faceted tungsten grains decorated with 100 nm oxide (BaAl2 O4 and Sc2 O3) particles and 20 nm Ba-containing particles.

Original language	English
Title of host publication	2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020
Pages	85-86
Number of pages	2
ISBN (Electronic)	9781538682883
DOIs	https://doi.org/10.1109/IVEC45766.2020.9520556
State	Published - Oct 19 2020
Event	21st IEEE International Conference on Vacuum Electronics, IVEC 2020 - Monterey, United States Duration: Oct 19 2020 → Oct 22 2020

Publication series

Name	2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020

Conference

Conference	21st IEEE International Conference on Vacuum Electronics, IVEC 2020
Country/Territory	United States
City	Monterey
Period	10/19/20 → 10/22/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

Keywords

Characterization
Electron microscopy
Scandate cathode
Spectroscopy
Surface

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation

Access to Document

10.1109/IVEC45766.2020.9520556

Cite this

Liu, X., Beck, M. J., Balk, T. J., & Vancil, B. K. (2020). Characterization of material phases on the surface and in the near-surface region of scandate cathodes. In 2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020 (pp. 85-86). (2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020). https://doi.org/10.1109/IVEC45766.2020.9520556

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title = "Characterization of material phases on the surface and in the near-surface region of scandate cathodes",

abstract = "The impressive electron emission capabilities of scandate cathodes continue to receive significant research attention, although there remain gaps in understanding the mechanistic reasons for their performance. This is partly due to lingering questions about the materials and microstructure of the cathode emitting surface. In the current study, scandate cathodes fabricated using related but distinct processes were emission-tested and then characterized using advanced electron microscopy and analytical spectroscopy techniques. The cathode surfaces were consistently observed to consist of faceted tungsten grains decorated with 100 nm oxide (BaAl2 O4 and Sc2 O3) particles and 20 nm Ba-containing particles.",

keywords = "Characterization, Electron microscopy, Scandate cathode, Spectroscopy, Surface",

author = "Xiaotao Liu and Beck, {Matthew J.} and Balk, {T. John} and Vancil, {Bernard K.}",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 21st IEEE International Conference on Vacuum Electronics, IVEC 2020 ; Conference date: 19-10-2020 Through 22-10-2020",

year = "2020",

month = oct,

day = "19",

doi = "10.1109/IVEC45766.2020.9520556",

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Liu, X, Beck, MJ , Balk, TJ & Vancil, BK 2020, Characterization of material phases on the surface and in the near-surface region of scandate cathodes. in 2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020. 2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020, pp. 85-86, 21st IEEE International Conference on Vacuum Electronics, IVEC 2020, Monterey, United States, 10/19/20. https://doi.org/10.1109/IVEC45766.2020.9520556

Characterization of material phases on the surface and in the near-surface region of scandate cathodes. / Liu, Xiaotao; Beck, Matthew J.; Balk, T. John et al.
2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020. 2020. p. 85-86 (2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - The impressive electron emission capabilities of scandate cathodes continue to receive significant research attention, although there remain gaps in understanding the mechanistic reasons for their performance. This is partly due to lingering questions about the materials and microstructure of the cathode emitting surface. In the current study, scandate cathodes fabricated using related but distinct processes were emission-tested and then characterized using advanced electron microscopy and analytical spectroscopy techniques. The cathode surfaces were consistently observed to consist of faceted tungsten grains decorated with 100 nm oxide (BaAl2 O4 and Sc2 O3) particles and 20 nm Ba-containing particles.

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KW - Surface

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Characterization of material phases on the surface and in the near-surface region of scandate cathodes

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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