Abstract
Ion Beam irradiation was used to modify the surface of a sulfonated polysulfone water treatment membrane. A beam of 25 keV H+ ions with three irradiation fluences (1×1013 ions/cm2, 5×1013 ions/cm2, and 1×1014 ions/cm2) was used for membrane irradiation. ATR-FTIR analyses were performed on the virgin and irradiated membranes in order to determine the changes to chemical structure incurred by ion beam irradiation. The results show that some of the sulphonic and C-H bonds were broken and new C-S bonds were formed after irradiation. AFM analyses show that membrane roughness decreased after irradiation. A significant increase in flux after ion beam irradiation was also observed, while the amount of cake accumulation on the membrane was decreased after ion beam irradiation. Hyhrophobicity, pore size distribution and selectivity of the membrane were not affected by ion beam irradiation.
| Original language | English |
|---|---|
| Pages | 2245-2260 |
| Number of pages | 16 |
| State | Published - 2005 |
| Event | 05AIChE: 2005 AIChE Annual Meeting and Fall Showcase - Cincinnati, OH, United States Duration: Oct 30 2005 → Nov 4 2005 |
Conference
| Conference | 05AIChE: 2005 AIChE Annual Meeting and Fall Showcase |
|---|---|
| Country/Territory | United States |
| City | Cincinnati, OH |
| Period | 10/30/05 → 11/4/05 |
Keywords
- Ion Beam Radiation
- Ion Fluence
- Membrane
- Surface Modifications
ASJC Scopus subject areas
- Engineering (all)