Chip form monitoring through advanced processing of cutting force sensor signals

R. Teti, I. S. Jawahir, K. Jemielniak, T. Segreto, S. Chen, J. Kossakowska

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

This paper draws on the activities of the CIRP Collaborative Work on "Round Robin on Chip Form Monitoring" carried out within the Scientific-Technical Committee Cutting (STC-C). This collaborative work involved the following main round robin activities: (a) generation, detection, storage and exchange of cutting force sensor signals obtained at different Laboratories during sensor-based monitoring of machining processes with variable cutting conditions yielding diverse chip forms, and (b) cutting force signal (CFS) characterization and feature extraction through advanced processing methodologies, both aimed at comparing chip form monitoring results achieved on the basis of innovative analysis paradigms.

Original languageEnglish
Pages (from-to)75-80
Number of pages6
JournalCIRP Annals - Manufacturing Technology
Volume55
Issue number1
DOIs
StatePublished - 2006

Bibliographical note

Funding Information:
STC-C Chairmen G. Byrne and D. Dornfeld are sincerely thanked for their encouragement and support in the development of the CIRP STC-C Collaborative Work “Round Robin on Chip Form Monitoring”. The research work at the University of Naples Federico II was carried out with support from the FP6 EC NoE on “I*PROMS” and the MIUR PRIN 2005 “ASMIM” Project.

Keywords

  • Advanced Signal Processing
  • Chip Form Monitoring
  • Cutting Force Sensor

ASJC Scopus subject areas

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

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