Classification of traumatic brain injury using support vector machine analysis of event-related Tsallis entropy

J. McBride, X. Zhao, T. Nichols, T. Abdul-Ahad, M. Wilson, V. Vagnini, N. Munro, D. Berry, Y. Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

An estimated 1.4 million Americans suffer from traumatic brain injury (TBI) each year [1]. Current methods of detecting TBI, such as computerized tomography (CT), magnetic resonance imaging (MRI), and Positron Emission Tomography (PET) scanning are time-consuming and expensive [2]. Here, the viability of a potentially more cost-effective means of detecting TBI is presented. Support vector machine (SVM) analyses are employed to classify 15 TBI and 15 normal individuals' EEG recordings taken during a working memory test. The features used by the SVM analyses include different sets of event-related Tsallis entropy functionals. The analyses demonstrate a strong correlation between the event-related functionals (ERFs) and the presence of TBI, attaining classification accuracies as high as 90%.

Original languageEnglish
Title of host publicationProceedings of the 2011 Biomedical Sciences and Engineering Conference
Subtitle of host publicationImage Informatics and Analytics in Biomedicine, BSEC 2011
DOIs
StatePublished - 2011
Event2011 Biomedical Sciences and Engineering Conference: Image Informatics and Analytics in Biomedicine, BSEC 2011 - Knoxville, TN, United States
Duration: Mar 15 2011Mar 17 2011

Publication series

NameProceedings of the 2011 Biomedical Sciences and Engineering Conference: Image Informatics and Analytics in Biomedicine, BSEC 2011

Conference

Conference2011 Biomedical Sciences and Engineering Conference: Image Informatics and Analytics in Biomedicine, BSEC 2011
Country/TerritoryUnited States
CityKnoxville, TN
Period3/15/113/17/11

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Biomedical Engineering

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