Complementary surface charge for enhanced capacitive deionization

X. Gao, S. Porada, A. Omosebi, K. L. Liu, P. M. Biesheuvel, J. Landon

Research output: Contribution to journalArticlepeer-review

179 Scopus citations

Fingerprint

Dive into the research topics of 'Complementary surface charge for enhanced capacitive deionization'. Together they form a unique fingerprint.

Chemical Engineering

Material Science

Engineering