Abstract
Based on recent discoveries, we introduce a method to project a single structured pattern onto an object and then reconstruct the three-dimensional range from the distortions in the reflected and captured image. Traditional structured light methods require several different patterns to recover the depth, without ambiguity or albedo sensitivity, and are corrupted by object movement during the projection/capture process. Our method efficiently combines multiple patterns into a single composite pattern projection allowing for real-time implementations. Because structured light techniques require standard image capture and projection technology, unlike time of arrival techniques, they are relatively low cost.
Original language | English |
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Pages (from-to) | 406-417 |
Number of pages | 12 |
Journal | Optics Express |
Volume | 11 |
Issue number | 5 |
DOIs | |
State | Published - Mar 2003 |
Bibliographical note
Copyright:Copyright 2018 Elsevier B.V., All rights reserved.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics