Abstract
In this paper, we consider an approach based on the adjusted signed log-likelihood ratio statistic for constructing a confidence interval for the mean of lognormal data with excess zeros. An extensive simulation study suggests that the proposed approach outperforms all the existing methods in terms of coverage probabilities and symmetry of upper and lower tail error probabilities. Finally, we analyzed two real-life datasets using the proposed approach.
Original language | English |
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Pages (from-to) | 149-156 |
Number of pages | 8 |
Journal | Biometrical Journal |
Volume | 48 |
Issue number | 1 |
DOIs | |
State | Published - Feb 2006 |
Keywords
- Adjusted signed log-likelihood ratio
- Goodness-of-fit test
- Skewed distribution
- Sufficient statistic
ASJC Scopus subject areas
- Statistics and Probability
- Statistics, Probability and Uncertainty