Consensus Variational and Monte Carlo Algorithms for Bayesian Nonparametric Clustering

Yang Ni, David Jones, Zeya Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

We propose both the first embarrassingly parallel consensus variational inference algorithm and a new consensus Monte Carlo algorithm for efficient implementation of Bayesian nonparametric mixture models. The proposed algorithms are based on a group clustering approach, and they substantially accelerate inference and reduce memory costs compared with standard Markov chain Monte Carlo and variational inference algorithms for clustering. We demonstrate that our proposed algorithms are significantly faster than competing methods while maintaining the same clustering accuracy. Due to their simplicity and embarrassingly parallel nature, our proposed algorithms are straightforward to implement and widely applicable beyond the models and applications considered in this paper.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE International Conference on Big Data, Big Data 2020
EditorsXintao Wu, Chris Jermaine, Li Xiong, Xiaohua Tony Hu, Olivera Kotevska, Siyuan Lu, Weijia Xu, Srinivas Aluru, Chengxiang Zhai, Eyhab Al-Masri, Zhiyuan Chen, Jeff Saltz
Pages204-209
Number of pages6
ISBN (Electronic)9781728162515
DOIs
StatePublished - Dec 10 2020
Event8th IEEE International Conference on Big Data, Big Data 2020 - Virtual, Atlanta, United States
Duration: Dec 10 2020Dec 13 2020

Publication series

NameProceedings - 2020 IEEE International Conference on Big Data, Big Data 2020

Conference

Conference8th IEEE International Conference on Big Data, Big Data 2020
Country/TerritoryUnited States
CityVirtual, Atlanta
Period12/10/2012/13/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

Keywords

  • big data
  • embarrassingly parallel computing
  • image clustering
  • unsupervised learning

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Information Systems
  • Information Systems and Management
  • Safety, Risk, Reliability and Quality

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