Abstract
This paper addresses the problem of how to constrain the set of viewpoints from which a 3D model will project to a given a set of occluding contour features. Our approach is new in that it relies on a precomputed occluding contour representation for polyhedral models that makes T-junctions, contour terminals and the change in contour topology explicit. Potential model-image correspondences of occluding contour features can be formulated as regions in viewpoint space defined by constraint boundaries since features are only visible from a restricted set of viewpoints. The implementation results demonstrate that T-junction features can efficiently constrain the space of viewpoints to produce a small, bounded viewpoint set that accounts for the occluding contour features.
Original language | English |
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Title of host publication | 1991 Proceedings - Workshop on Directions in Automated CAD-Based Vision, CADVIS 1991 |
Pages | 54-63 |
Number of pages | 10 |
ISBN (Electronic) | 0818621478, 9780818621475 |
DOIs | |
State | Published - 1991 |
Event | 1991 Workshop on Directions in Automated CAD-Based Vision, CADVIS 1991 - Maui, United States Duration: Jun 2 1991 → Jun 3 1991 |
Publication series
Name | 1991 Proceedings - Workshop on Directions in Automated CAD-Based Vision, CADVIS 1991 |
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Conference
Conference | 1991 Workshop on Directions in Automated CAD-Based Vision, CADVIS 1991 |
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Country/Territory | United States |
City | Maui |
Period | 6/2/91 → 6/3/91 |
Bibliographical note
Publisher Copyright:© 1991 Proceedings - Workshop on Directions in Automated CAD-Based Vision, CADVIS 1991. All rights reserved.
Funding
Support of the University of Wisconsin Graduate School under Project No. 910288 and the National Science Foundation under Grant Nos. IRI-8802436 and DCR-8521228 is gratefully acknowledged.
Funders | Funder number |
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National Science Foundation (NSF) | IRI-8802436, DCR-8521228 |
Graduate School, Duke University | 910288 |
ASJC Scopus subject areas
- Computer Graphics and Computer-Aided Design
- Computer Vision and Pattern Recognition