Skip to main navigation
Skip to search
Skip to main content
University of Kentucky Home
LOGIN & Help
Home
Research units
Researchers
Projects & Grants
Research Output
Facilities & Equipment
Honors & Awards
Activities
Search by expertise, name or affiliation
Critical phenomena in resistor networks
J. P. Straley
Physics And Astronomy
Center for Computational Sciences
Research output
:
Contribution to journal
›
Article
›
peer-review
173
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Critical phenomena in resistor networks'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering
Resistor Network
100%
Critical Point
100%
Correlation Length
33%
Parametric Representation
33%
Zeros
33%
Resistor
33%
Frequency Dependence
33%
Prediction
33%
Phase Composition
33%
Model
33%
Mathematics
Critical Point
100%
Resistor
100%
Zeros
33%
Lattices
33%
Parametric
33%
Function Representation
33%
correlation length ξ
33%
Homogeneous Function
33%
Prediction
33%
Immunology and Microbiology
Conductance
100%
Length
33%
Impedance
33%