TY - GEN
T1 - Data acquisition and quality analysis of 3-dimensional fingerprints
AU - Wang, Yongchang
AU - Hao, Qi
AU - Fatehpuria, Abhishika
AU - Hassebrook, Laurence G.
AU - Lau, Daniel L.
PY - 2009
Y1 - 2009
N2 - This paper introduces a new technology of non-contact 3D fingerprint capture and processing for higher quality fingerprint data acquisition. The system relies on a real-time 3D sensor using structured light illumination (SLI), which generates both texture and detailed ridge depth information. The high resolution 3D scans are then converted into flat equivalent images. As a result, many limitations imposed upon conventional fingerprint capture and processing can be reduced by the unobtrusiveness of this approach and the extra depth information acquired. The image quality is evaluated and analyzed using NIST fingerprint image software. A comparison is performed between the unraveled 3D fingerprints and their 2D plain counterparts in terms of fingerprint quality.
AB - This paper introduces a new technology of non-contact 3D fingerprint capture and processing for higher quality fingerprint data acquisition. The system relies on a real-time 3D sensor using structured light illumination (SLI), which generates both texture and detailed ridge depth information. The high resolution 3D scans are then converted into flat equivalent images. As a result, many limitations imposed upon conventional fingerprint capture and processing can be reduced by the unobtrusiveness of this approach and the extra depth information acquired. The image quality is evaluated and analyzed using NIST fingerprint image software. A comparison is performed between the unraveled 3D fingerprints and their 2D plain counterparts in terms of fingerprint quality.
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U2 - 10.1109/BIDS.2009.5507527
DO - 10.1109/BIDS.2009.5507527
M3 - Conference contribution
AN - SCOPUS:77954996931
SN - 9781424452767
T3 - 2009 1st IEEE International Conference on Biometrics, Identity and Security, BIdS 2009
BT - 2009 1st IEEE International Conference on Biometrics, Identity and Security, BIdS 2009
T2 - 2009 1st IEEE International Conference on Biometrics, Identity and Security, BIdS 2009
Y2 - 22 September 2009 through 23 September 2009
ER -