Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Ruipeng Li; Jeremy W. Ward; Detlef M. Smilgies; Marcia M. Payne; John E. Anthony; Oana D. Jurchescu; Aram Amassian

doi:10.1002/adma.201201856

Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Ruipeng Li, Jeremy W. Ward, Detlef M. Smilgies, Marcia M. Payne, John E. Anthony, Oana D. Jurchescu, Aram Amassian

Chemistry

Research output: Contribution to journal › Article › peer-review

69 Scopus citations

Abstract

X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.

Original language	English
Pages (from-to)	5553-5558
Number of pages	6
Journal	Advanced Materials
Volume	24
Issue number	41
DOIs	https://doi.org/10.1002/adma.201201856
State	Published - Nov 2 2012

Keywords

OTFT
dif-TES-ADT
microbeam
μGIWAXS

ASJC Scopus subject areas

General Materials Science
Mechanics of Materials
Mechanical Engineering

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10.1002/adma.201201856

Cite this

@article{d6f552fb0275453090affc2d81d6496e,

title = "Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport",

abstract = "X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.",

keywords = "OTFT, dif-TES-ADT, microbeam, μGIWAXS",

author = "Ruipeng Li and Ward, {Jeremy W.} and Smilgies, {Detlef M.} and Payne, {Marcia M.} and Anthony, {John E.} and Jurchescu, {Oana D.} and Aram Amassian",

year = "2012",

month = nov,

day = "2",

doi = "10.1002/adma.201201856",

language = "English",

volume = "24",

pages = "5553--5558",

number = "41",

}

TY - JOUR

T1 - Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

AU - Li, Ruipeng

AU - Ward, Jeremy W.

AU - Smilgies, Detlef M.

AU - Payne, Marcia M.

AU - Anthony, John E.

AU - Jurchescu, Oana D.

AU - Amassian, Aram

PY - 2012/11/2

Y1 - 2012/11/2

N2 - X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.

AB - X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.

KW - OTFT

KW - dif-TES-ADT

KW - microbeam

KW - μGIWAXS

UR - http://www.scopus.com/inward/record.url?scp=84868128474&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84868128474&partnerID=8YFLogxK

U2 - 10.1002/adma.201201856

DO - 10.1002/adma.201201856

M3 - Article

C2 - 22887742

AN - SCOPUS:84868128474

SN - 0935-9648

VL - 24

SP - 5553

EP - 5558

JO - Advanced Materials

JF - Advanced Materials

IS - 41

ER -

Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Abstract

Keywords

ASJC Scopus subject areas

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