Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Ruipeng Li, Jeremy W. Ward, Detlef M. Smilgies, Marcia M. Payne, John E. Anthony, Oana D. Jurchescu, Aram Amassian

Research output: Contribution to journalArticlepeer-review

62 Scopus citations

Abstract

X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.

Original languageEnglish
Pages (from-to)5553-5558
Number of pages6
JournalAdvanced Materials
Volume24
Issue number41
DOIs
StatePublished - Nov 2 2012

Keywords

  • μGIWAXS
  • dif-TES-ADT
  • microbeam
  • OTFT

ASJC Scopus subject areas

  • Materials Science (all)
  • Mechanics of Materials
  • Mechanical Engineering

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