TY - GEN
T1 - Direct work function measurement of activated M-type dispenser cathodes
AU - Swartzentruber, Phillip
AU - Balk, T. John
AU - Tarter, James O.
AU - Busbaher, Daniel
PY - 2014
Y1 - 2014
N2 - M-type dispenser cathodes were activated in a vacuum chamber and the absolute work function determined from the contact potential difference between the cathode and a precisely calibrated probe tip. The experimental test setup allowed for cathodes to be activated and the work function measured without breaking vacuum. In addition to the commercially available Os-Ru coating from Ceradyne, Inc., a 3M Company, the work functions of Os-Ru coatings with engineered microstructures were measured to quantify microstructural influences. The work functions of both pre- and post-activation cathodes are presented and discussed in light of the microstructure of their Os-Ru coatings.
AB - M-type dispenser cathodes were activated in a vacuum chamber and the absolute work function determined from the contact potential difference between the cathode and a precisely calibrated probe tip. The experimental test setup allowed for cathodes to be activated and the work function measured without breaking vacuum. In addition to the commercially available Os-Ru coating from Ceradyne, Inc., a 3M Company, the work functions of Os-Ru coatings with engineered microstructures were measured to quantify microstructural influences. The work functions of both pre- and post-activation cathodes are presented and discussed in light of the microstructure of their Os-Ru coatings.
KW - M-type
KW - Os-Ru
KW - microstructure
KW - work function
UR - http://www.scopus.com/inward/record.url?scp=84905391475&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84905391475&partnerID=8YFLogxK
U2 - 10.1109/IVEC.2014.6857526
DO - 10.1109/IVEC.2014.6857526
M3 - Conference contribution
AN - SCOPUS:84905391475
SN - 9781467301879
T3 - IEEE International Vacuum Electronics Conference, IVEC 2014
SP - 135
EP - 136
BT - IEEE International Vacuum Electronics Conference, IVEC 2014
T2 - 15th IEEE International Vacuum Electronics Conference, IVEC 2014
Y2 - 22 April 2014 through 24 April 2014
ER -