Doping-type dependence of damage in silicon diodes exposed to X-ray, proton, and He+ irradiations

M. Caussanel, A. Canals, S. K. Dixit, M. J. Beck, A. D. Touboul, R. D. Schrimpf, D. M. Fleetwood, S. T. Pantelides

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

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