Abstract
Weld pool surface is believed to contain sufficient information to determine the weld penetration from which skilled welders are able to control the welding process to desired penetration states. However, it is unclear how human welders extract the weld penetration from the observed weld pool surface. In this paper, a novel method is proposed to determine the weld penetration based on the dynamic change of the weld pool surface. This study observes/measures/analyzes the development of a weld pool from partial to full penetration and correlates such change to the weld penetration. Ideally, similar trends in the weld pool surface should be observed when the weld penetration changes from partial to full penetration despite the amperage used and material welded. Correlating the weld pool surface reflecting grayness and the development of the weld penetration from experiments shows: (1) the weld pool reflection intensity will increase while the weld penetration is increasing; (2) the increasing trends of weld pool reflection intensity will decrease when the full penetration is achieved; (3) the weld pool reflection intensity will increase after the full penetration is achieved. Such trend in the weld pool surface reflection intensity when the weld penetration develops can facilitate future work on automatically detecting and control the weld penetration using the weld pool surface as the feedback.
Original language | English |
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Title of host publication | 2016 IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2016 |
Pages | 548-553 |
Number of pages | 6 |
ISBN (Electronic) | 9781509020652 |
DOIs | |
State | Published - Sep 26 2016 |
Event | 2016 IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2016 - Banff, Canada Duration: Jul 12 2016 → Jul 15 2016 |
Publication series
Name | IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM |
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Volume | 2016-September |
Conference
Conference | 2016 IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2016 |
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Country/Territory | Canada |
City | Banff |
Period | 7/12/16 → 7/15/16 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Control and Systems Engineering
- Computer Science Applications
- Software