Abstract
The dewetting dynamics of a toluene film confined within a copper ring on a deformable PMMA film is studied. The toluene film experiences evaporation and dewetting, which leads to the formation of a circular contact line around the center of the copper ring. The contact line recedes smoothly toward the copper ring at a constant velocity until reaching a dynamic "stick" state to form the first circular polymer ridge. The average receding velocity is found to be dependent on the dimensions of the copper ring (the copper ring diameter and the cross-sectional diameter of the copper wire) and the thickness of the PMMA films. A model is presented to qualitatively explain the evaporative dewetting phenomenon.
| Original language | English |
|---|---|
| Pages (from-to) | 4024-4031 |
| Number of pages | 8 |
| Journal | Langmuir |
| Volume | 31 |
| Issue number | 13 |
| DOIs | |
| State | Published - Mar 18 2015 |
Bibliographical note
Publisher Copyright:© 2015 American Chemical Society.
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Surfaces and Interfaces
- Spectroscopy
- Electrochemistry