TY - JOUR
T1 - Effect of ozone on the stability of solution-processed anthradithiophene- based organic field-effect transistors
AU - Nasrallah, Iyad
AU - Banger, Kulbinder K.
AU - Vaynzof, Yana
AU - Payne, Marcia M.
AU - Too, Patrick
AU - Jongman, Jan
AU - Anthony, John E.
AU - Sirringhaus, Henning
PY - 2014/7/8
Y1 - 2014/7/8
N2 - We have investigated the degradation effects of ozone exposure on organic field-effect transistors based on 2,8-difluoro-5,11-bis(triethylsilylethynyl) anthradithiophene as the organic semiconducting channel layer, as well as on thin films of this widely used, high-mobility, small molecule semiconductor. Electrical I-V measurements showed a loss of transistor characteristic behavior. We present 1H Nuclear Magnetic Resonance (NMR) spectroscopy results as well as X-ray Photoemission Spectroscopy (XPS) and Fourier Transform Infrared (FTIR) spectroscopy measurements showing the oxidation of the parent molecule, from which we suggest various possible reaction paths.
AB - We have investigated the degradation effects of ozone exposure on organic field-effect transistors based on 2,8-difluoro-5,11-bis(triethylsilylethynyl) anthradithiophene as the organic semiconducting channel layer, as well as on thin films of this widely used, high-mobility, small molecule semiconductor. Electrical I-V measurements showed a loss of transistor characteristic behavior. We present 1H Nuclear Magnetic Resonance (NMR) spectroscopy results as well as X-ray Photoemission Spectroscopy (XPS) and Fourier Transform Infrared (FTIR) spectroscopy measurements showing the oxidation of the parent molecule, from which we suggest various possible reaction paths.
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U2 - 10.1021/cm501397y
DO - 10.1021/cm501397y
M3 - Article
AN - SCOPUS:84903952077
SN - 0897-4756
VL - 26
SP - 3914
EP - 3919
JO - Chemistry of Materials
JF - Chemistry of Materials
IS - 13
ER -