Abstract
We have investigated the degradation effects of ozone exposure on organic field-effect transistors based on 2,8-difluoro-5,11-bis(triethylsilylethynyl) anthradithiophene as the organic semiconducting channel layer, as well as on thin films of this widely used, high-mobility, small molecule semiconductor. Electrical I-V measurements showed a loss of transistor characteristic behavior. We present 1H Nuclear Magnetic Resonance (NMR) spectroscopy results as well as X-ray Photoemission Spectroscopy (XPS) and Fourier Transform Infrared (FTIR) spectroscopy measurements showing the oxidation of the parent molecule, from which we suggest various possible reaction paths.
| Original language | English |
|---|---|
| Pages (from-to) | 3914-3919 |
| Number of pages | 6 |
| Journal | Chemistry of Materials |
| Volume | 26 |
| Issue number | 13 |
| DOIs | |
| State | Published - Jul 8 2014 |
ASJC Scopus subject areas
- General Chemistry
- General Chemical Engineering
- Materials Chemistry
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