Electroexcitation of isoscalar states in sup16O

T. N. Buti, J. Kelly, W. Bertozzi, J. M. Finn, F. W. Hersman, C. Hyde-Wright, M. V. Hynes, M. A. Kovash, S. Kowalski, R. W. Lourie, B. Murdock, B. E. Norum, B. Pugh, C. P. Sargent, W. Turchinetz, B. L. Berman

Research output: Contribution to journalArticlepeer-review

60 Scopus citations

Abstract

We report high resolution measurements of inelastic electron scattering to all narrow normal-parity states of O16 up to 12.05 MeV, which include states with Jn(Ex MeV): 02+(6.049), 03+(12.049), 11-(7.117), 21+(6.917), 22+(9.845), 23+(11.52), 31-(6.130), 41+(10.356), and 42+(11.097). The measurements were performed primarily at 90°and 160°and span momentum transfers between 0.6 and 2.6 fm-1. Improved line shape fitting techniques have been developed. These are the first electron scattering measurements for the 42+ state and of second form-factor maxima for several states. The form factor for excitation of the 22+ state is strikingly different from that of the other 2+ states and indicates a transition density peaked in the interior. Transition charge densities were extracted from a combined data set that includes earlier electron scattering data renormalized to a recent analysis of elastic scattering from O16. Comparisons have been made with several structure models, including the Brown-Green model, the weak-coupling model, a 2Latin small letter h with stroke shell model, and the tetrahedral alpha-cluster model.

Original languageEnglish
Pages (from-to)755-775
Number of pages21
JournalPhysical Review C - Nuclear Physics
Volume33
Issue number3
DOIs
StatePublished - 1986

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Fingerprint

Dive into the research topics of 'Electroexcitation of isoscalar states in sup16O'. Together they form a unique fingerprint.

Cite this