Fingerprint
Dive into the research topics of 'Electromigration-induced damage in bamboo Al interconnects'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Electromigration-induced damage in bamboo Al interconnects
J. Böhm, C. A. Volkert, R. Mönig, T. J. Balk, E. Arzt
Research output: Contribution to journal › Article › peer-review
19
Scopus
citations