Electron-helium scattering in a 1.17 eV laser field: The effect of polarization direction

B. A. Deharak, Benjamin Nosarzewski, Mahsa Siavashpouri, N. L.S. Martin

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

We report measurements of one-photon emission during the elastic scattering of electrons by He atoms through 90' in the presence of 1.17 eV photons from a Nd:YAG laser. The incident energy of the electrons was in the range 30-200 eV and the linear polarization direction of the laser was varied over 180' in the plane, perpendicular to the scattering plane, that contains the momentum transfer direction. Our results are perfectly consistent with the Kroll-Watson approximation. In particular, we see no evidence of free-free transitions when the polarization is perpendicular to the momentum transfer direction.

Original languageEnglish
Article number032709
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume90
Issue number3
DOIs
StatePublished - 2014

Bibliographical note

Publisher Copyright:
© 2014 American Physical Society.

Funding

FundersFunder number
U.S. Department of Energy Chinese Academy of Sciences Guangzhou Municipal Science and Technology Project Oak Ridge National Laboratory Extreme Science and Engineering Discovery Environment National Science Foundation National Energy Research Scientific Computing Center National Natural Science Foundation of China1402899
U.S. Department of Energy Chinese Academy of Sciences Guangzhou Municipal Science and Technology Project Oak Ridge National Laboratory Extreme Science and Engineering Discovery Environment National Science Foundation National Energy Research Scientific Computing Center National Natural Science Foundation of China

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

    Fingerprint

    Dive into the research topics of 'Electron-helium scattering in a 1.17 eV laser field: The effect of polarization direction'. Together they form a unique fingerprint.

    Cite this