Electrostatic force microscopy and electrical isolation of etched few-layer graphene nano-domains

D. Patrick Hunley, Abhishek Sundararajan, Mathias J. Boland, Douglas R. Strachan

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2 Scopus citations


Nanostructured bi-layer graphene samples formed through catalytic etching are investigated with electrostatic force microscopy. The measurements and supporting computations show a variation in the microscopy signal for different nano-domains that are indicative of changes in capacitive coupling related to their small sizes. Abrupt capacitance variations detected across etch tracks indicates that the nano-domains have strong electrical isolation between them. Comparison of the measurements to a resistor-capacitor model indicates that the resistance between two bi-layer graphene regions separated by an approximately 10 nm wide etch track is greater than about 1 × 10 12 Ω with a corresponding gap resistivity greater than about 3 × 10 14 Ω · nm. This extremely large gap resistivity suggests that catalytic etch tracks within few-layer graphene samples are sufficient for providing electrical isolation between separate nano-domains that could permit their use in constructing atomically thin nanogap electrodes, interconnects, and nanoribbons.

Original languageEnglish
Article number243109
JournalApplied Physics Letters
Issue number24
StatePublished - Dec 15 2014

Bibliographical note

Publisher Copyright:
© 2014 AIP Publishing LLC.

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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