Abstract
Electrostatic force microscopy (EFM) is a widely used scanning-probe technique for the characterization of electronic properties of nanoscale samples without the use of electrical contacts. Here we review the basic principles of EFM, developing a quantitative framework by which EFM measurements of extended nanostructures can be understood. We support our calculations with experimental data of EFM of carbon nanotubes and conducting or insulating electrospun polyaniline-based nanofibers. Furthermore, we explore routes towards extending EFM as a means of non-invasively probing the local electronic density of states of carbon nanotubes.
| Original language | English |
|---|---|
| Pages (from-to) | 75-80 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium Proceedings |
| Volume | 1025 |
| State | Published - 2008 |
| Event | Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy - Boston, MA, United States Duration: Nov 26 2007 → Nov 30 2007 |
Funding
| Funders | Funder number |
|---|---|
| UK Industrial Decarbonization Research and Innovation Centre | 53706 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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