Ellipsometric determination of the optical constants of C60 (Buckminsterfullerene) films

S. L. Ren, Y. Wang, A. M. Rao, E. McRae, J. M. Holden, T. Hager, Kai An Wang, Wen Tse Lee, H. F. Ni, J. Selegue, P. C. Eklund

Research output: Contribution to journalArticlepeer-review

250 Scopus citations


We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy and electron-energy-loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single-electron excitations across the HOMO-LUMO gap.

Original languageEnglish
Pages (from-to)2678-2680
Number of pages3
JournalApplied Physics Letters
Issue number21
StatePublished - 1991

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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