Fabrication and characterization of narrow-band bragg-reflection filters in silicon-on-insulator ridge waveguides

Thomas Edward Murphy, Jeffrey Todd Hastings, Henry I. Smith

Research output: Contribution to journalArticlepeer-review

161 Scopus citations

Abstract

We describe the design, fabrication and measurement of an integrated-optical Bragg grating filter, operating at a free-space wavelength of 1543 nm, based upon a silicon-on-insulator (SOI) ridge waveguide. The measured spectral response for a 4-mm long grating has a bandwidth of 15 GHz (0.12 nm), and shows good agreement with theoretical predictions.

Original languageEnglish
Pages (from-to)1938-1942
Number of pages5
JournalJournal of Lightwave Technology
Volume19
Issue number12
DOIs
StatePublished - Dec 2001

Bibliographical note

Copyright:
Copyright 2013 Elsevier B.V., All rights reserved.

Keywords

  • Bragg scattering
  • Gratings
  • Optical planar waveguides
  • Ridge waveguides
  • Silicon-on-insulator (SOI) technology
  • Waveguide components
  • Waveguide filters

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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