Abstract
Chromium conversion coating (CCC) formation was monitored on copper-containing aluminum alloys AA2024-T3 and a specially cast AlxCuyMgz ingot using Raman spectroscopy of the 860 cm-1 band. The AlxCuyMgz ingot's different phases were compositionally analyzed with energy-dispersive spectroscopy (EDS) and Auger electron spectroscopy (AES) before and after treatments using commercial AlodineTM 1200S chromium solution. Profilometry and Raman intensity of the 860 cm-1 band were used to gauge CCC film thickness on AA-2024-T3 alloy. A linear relationship between CCC thickness and the integrated 860 cm-1 band was shown to exist on AA-2024 alloy. Raman intensity of the 860 cm-1 band was also integrated and spatially mapped using commercially available software. These results were verified with AES depth profiling using an Ar+ ion sputter. CCC formation was found to be slower on the AlxCuyMgz phases with higher copper content. Similarly, in 2024-T3, CCC formation was suppressed on S-phase Al2CuMg and `depressed' Al20Cu2FeMn intermetallics of 2024 aluminum alloy. Fe(CN)63-/4- adsorption on the AlxCuyMgz ingot phases, Cu, Al, Mg, and AA2024-T3 were characterized by Raman in the 2100 cm-1 range.
Original language | English |
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Pages (from-to) | 4494-4501 |
Number of pages | 8 |
Journal | Journal of the Electrochemical Society |
Volume | 147 |
Issue number | 12 |
DOIs | |
State | Published - Dec 2000 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Renewable Energy, Sustainability and the Environment
- Surfaces, Coatings and Films
- Electrochemistry
- Materials Chemistry