High quality nanogap electrodes for electronic transport measurements of single molecules

Danvers E. Johnston, Douglas R. Strachan, Beth S. Guiton, Peter K. Davies, Dawn A. Bonnell, A. T.Charlie Johnson

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Electromigrated nanogaps have frequently been used in molecular scale electronics. We use a computer controlled electromigration (CCE) process for creating nanogaps at room temperature permitting characterization of bare gaps prior to application of molecules. This is very different from other approaches where nanogaps are formed by a simple voltage ramp performed at low temperature with molecules already attached to the nanowire. Using CCE, we formed nanogaps at room temperature on both thick substrates and thin SiNx membranes compatible with transmission electron microscopy. We showed that the electromigration process evolves through an initial bulk behavior regime and crosses over to a ballistic conduction regime. It was found that nanogaps formed on SiNx membranes are clean of parasitic conduction pathways and contamination. This work has implications to the design of clean metallic electrodes for use in nanoscale devices.

Original languageEnglish
Title of host publication2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
Pages562-565
Number of pages4
StatePublished - 2007
Event2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007 - Santa Clara, CA, United States
Duration: May 20 2007May 24 2007

Publication series

Name2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
Volume1

Conference

Conference2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007
Country/TerritoryUnited States
CitySanta Clara, CA
Period5/20/075/24/07

Keywords

  • Electromigration
  • Molecular electronics
  • Nanogap

ASJC Scopus subject areas

  • Mechanical Engineering

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