Abstract
A new high resolution photoelectron spectrometer designed for core level photoelectron studies of gas phase volatile and involatile compounds using synchrotron radiation is briefly described. Xenon NOO Auger spectral linewidths of 0.13 eV indicate that the electron resolution is < 0.05 eV. The Xe 4d photoelectron linewidth of ≈0.20 eV, for an inherent linewidth of ≥ 0.13 eV, shows that the photon width is close to the theoretical 0.12 Å (0.09 eV at 94 eV). This resolution is sufficient to observe, for the first time, vibrational splitting of the Si 2p core level of SiH4 and ligand field splitting of the Xe 4d core level of XeF2.
| Original language | English |
|---|---|
| Pages (from-to) | 1-5 |
| Number of pages | 5 |
| Journal | Chemical Physics Letters |
| Volume | 165 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 5 1990 |
Bibliographical note
Funding Information:The authors would like to thank G.J. Schrobilgen for providing the XeF, and the staff at the Synchrotron Radiation Center (Stoughton) for their technical support. We are grateful to the National Research Council (NRC) of Canada and the Natural Sciences and Engineering Research Council (NSERC) of Canada for financial support.
Funding
The authors would like to thank G.J. Schrobilgen for providing the XeF, and the staff at the Synchrotron Radiation Center (Stoughton) for their technical support. We are grateful to the National Research Council (NRC) of Canada and the Natural Sciences and Engineering Research Council (NSERC) of Canada for financial support.
| Funders | Funder number |
|---|---|
| National Research Council | |
| Natural Sciences and Engineering Research Council of Canada |
ASJC Scopus subject areas
- General Physics and Astronomy
- Physical and Theoretical Chemistry