High resolution molecular gas phase photoelectron spectra of core levels using synchrotron radiation - vibrational and ligand field splittings

J. D. Bozek, J. N. Cutler, G. M. Bancroft, L. L. Coatsworth, K. H. Tan, D. S. Yang, R. G. Cavell

Research output: Contribution to journalArticlepeer-review

49 Scopus citations

Abstract

A new high resolution photoelectron spectrometer designed for core level photoelectron studies of gas phase volatile and involatile compounds using synchrotron radiation is briefly described. Xenon NOO Auger spectral linewidths of 0.13 eV indicate that the electron resolution is < 0.05 eV. The Xe 4d photoelectron linewidth of ≈0.20 eV, for an inherent linewidth of ≥ 0.13 eV, shows that the photon width is close to the theoretical 0.12 Å (0.09 eV at 94 eV). This resolution is sufficient to observe, for the first time, vibrational splitting of the Si 2p core level of SiH4 and ligand field splitting of the Xe 4d core level of XeF2.

Original languageEnglish
Pages (from-to)1-5
Number of pages5
JournalChemical Physics Letters
Volume165
Issue number1
DOIs
StatePublished - Jan 5 1990

Bibliographical note

Funding Information:
The authors would like to thank G.J. Schrobilgen for providing the XeF, and the staff at the Synchrotron Radiation Center (Stoughton) for their technical support. We are grateful to the National Research Council (NRC) of Canada and the Natural Sciences and Engineering Research Council (NSERC) of Canada for financial support.

ASJC Scopus subject areas

  • Physics and Astronomy (all)
  • Physical and Theoretical Chemistry

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