High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems

Antonio M. Mantica; Michael J. Detisch; T. John Balk

doi:10.1109/IVEC53421.2022.10292215

High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems

Antonio M. Mantica, Michael J. Detisch, T. John Balk

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Understanding the work function of materials used in vacuum electron devices (VEDs) is an important contribution to cathode research today. This is because a lower work function material has the capability to thermionically emit high current densities at lower operating temperatures, meaning longer lifetimes for the VEDs. Two work function analysis techniques are outlined here: measurement of contact potential difference (CPD) at high temperatures and Richardson-Dushman analysis on collected current density data. Both techniques are performed using a Kelvin probe. The techniques are outlined and data collected on pure tungsten are provided.

Original language	English
Title of host publication	2022 23rd International Vacuum Electronics Conference, IVEC 2022
Pages	228-229
Number of pages	2
ISBN (Electronic)	9781665443258
DOIs	https://doi.org/10.1109/IVEC53421.2022.10292215
State	Published - 2022
Event	23rd International Vacuum Electronics Conference, IVEC 2022 - Monterey, United States Duration: Apr 25 2022 → Apr 29 2022

Publication series

Name	2022 23rd International Vacuum Electronics Conference, IVEC 2022

Conference

Conference	23rd International Vacuum Electronics Conference, IVEC 2022
Country/Territory	United States
City	Monterey
Period	4/25/22 → 4/29/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

contact potential difference
Kelvin probe
thermionic emission
work function

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/IVEC53421.2022.10292215

Cite this

@inproceedings{d4278cfaf2234f819bed2f1f41edbb39,

title = "High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems",

abstract = "Understanding the work function of materials used in vacuum electron devices (VEDs) is an important contribution to cathode research today. This is because a lower work function material has the capability to thermionically emit high current densities at lower operating temperatures, meaning longer lifetimes for the VEDs. Two work function analysis techniques are outlined here: measurement of contact potential difference (CPD) at high temperatures and Richardson-Dushman analysis on collected current density data. Both techniques are performed using a Kelvin probe. The techniques are outlined and data collected on pure tungsten are provided.",

keywords = "contact potential difference, Kelvin probe, thermionic emission, work function",

author = "Mantica, {Antonio M.} and Detisch, {Michael J.} and Balk, {T. John}",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 23rd International Vacuum Electronics Conference, IVEC 2022 ; Conference date: 25-04-2022 Through 29-04-2022",

year = "2022",

doi = "10.1109/IVEC53421.2022.10292215",

language = "English",

series = "2022 23rd International Vacuum Electronics Conference, IVEC 2022",

pages = "228--229",

booktitle = "2022 23rd International Vacuum Electronics Conference, IVEC 2022",

}

Mantica, AM, Detisch, MJ & Balk, TJ 2022, High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems. in 2022 23rd International Vacuum Electronics Conference, IVEC 2022. 2022 23rd International Vacuum Electronics Conference, IVEC 2022, pp. 228-229, 23rd International Vacuum Electronics Conference, IVEC 2022, Monterey, United States, 4/25/22. https://doi.org/10.1109/IVEC53421.2022.10292215

High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems. / Mantica, Antonio M.; Detisch, Michael J.; Balk, T. John.
2022 23rd International Vacuum Electronics Conference, IVEC 2022. 2022. p. 228-229 (2022 23rd International Vacuum Electronics Conference, IVEC 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems

AU - Mantica, Antonio M.

AU - Detisch, Michael J.

AU - Balk, T. John

PY - 2022

Y1 - 2022

N2 - Understanding the work function of materials used in vacuum electron devices (VEDs) is an important contribution to cathode research today. This is because a lower work function material has the capability to thermionically emit high current densities at lower operating temperatures, meaning longer lifetimes for the VEDs. Two work function analysis techniques are outlined here: measurement of contact potential difference (CPD) at high temperatures and Richardson-Dushman analysis on collected current density data. Both techniques are performed using a Kelvin probe. The techniques are outlined and data collected on pure tungsten are provided.

AB - Understanding the work function of materials used in vacuum electron devices (VEDs) is an important contribution to cathode research today. This is because a lower work function material has the capability to thermionically emit high current densities at lower operating temperatures, meaning longer lifetimes for the VEDs. Two work function analysis techniques are outlined here: measurement of contact potential difference (CPD) at high temperatures and Richardson-Dushman analysis on collected current density data. Both techniques are performed using a Kelvin probe. The techniques are outlined and data collected on pure tungsten are provided.

KW - contact potential difference

KW - Kelvin probe

KW - thermionic emission

KW - work function

UR - http://www.scopus.com/inward/record.url?scp=85178518079&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85178518079&partnerID=8YFLogxK

U2 - 10.1109/IVEC53421.2022.10292215

DO - 10.1109/IVEC53421.2022.10292215

M3 - Conference contribution

AN - SCOPUS:85178518079

T3 - 2022 23rd International Vacuum Electronics Conference, IVEC 2022

SP - 228

EP - 229

BT - 2022 23rd International Vacuum Electronics Conference, IVEC 2022

T2 - 23rd International Vacuum Electronics Conference, IVEC 2022

Y2 - 25 April 2022 through 29 April 2022

ER -

High-Temperature Contact Potential Difference and Thermionic Emission Analysis Using Kelvin Probe Systems

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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