Abstract
We demonstrate a technique for simultaneously fabricating arrays of electromigrated nanogaps using a single-ramp feedback-controlled voltage clamp. The parallel formation is achieved by controlling the applied bias with a voltage clamp directly adjacent to a nanogap array containing low-impedance shunts. Self-balancing of the electromigration permits the two voltage leads to fix the applied voltage across all the forming nanogaps simultaneously. This single-ramp feedback-controlled voltage clamp method is at least a 100 times faster than previous work utilizing computer feedback control of parallel nanojunctions and also circumvents the deleterious thermal runaway that occurs in the conventional single-ramp technique.
| Original language | English |
|---|---|
| Article number | 5582297 |
| Pages (from-to) | 806-809 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Nanotechnology |
| Volume | 10 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jul 2011 |
Bibliographical note
Funding Information:Manuscript received May 10, 2010; revised July 27, 2010; accepted September 15, 2010. Date of publication September 23, 2010; date of current version July 8, 2011. This work was supported by the National Science Foundation (NSF) under Grant DMR-0805136, by the Kentucky NSF Experimental Program to Stimulate Competitive Research (EPSCoR) program under Award EPS-0814194, and by the Center for Advanced Materials (CAM), University of Kentucky (UK). The review of this paper was arranged by Associate Editor G. Ramanath.
Keywords
- Electromigration
- molecular electronics
- nanoelectronics
- nanogap electrodes
- parallel nanogaps
ASJC Scopus subject areas
- Computer Science Applications
- Electrical and Electronic Engineering