Image reconstruction from TE scattering data using equation of strong permittivity fluctuation

Jianglei Ma, Weng Cho Chew, Cai Cheng Lu, Jiming Song

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

Compared to the TM case, the inverse scattering problem for the TE incident field is more complicated due to its stronger nonlinearity. This work provides an effective method for the reconstruction of two-dimensional (2-D) inhomogeneous dielectric objects from TE scattering data. The algorithm applies the distorted Born iterative method to the integral equation of strong permittivity fluctuation to reconstruct scatterers with high-permittivity contrast. Numerical simulations are performed and the results show that the distorted Born iterative method (DBIM) for strong permittivity fluctuation (SPF-DBIM) converges faster and can obtain better reconstructions for objects with larger dimensions and higher contrasts in comparison with ordinary DBIM. A frequency hopping technique is also applied to further increase the contrast.

Original languageEnglish
Pages (from-to)860-867
Number of pages8
JournalIEEE Transactions on Antennas and Propagation
Volume48
Issue number6
DOIs
StatePublished - Jun 2000

Bibliographical note

Funding Information:
Manuscript received July 31, 1997; revised October 21, 1999. This work was supported by the Office of Naval Research under Grant N00014-95-1-0872, the National Science Foundation under Grant NSF ECS 93-02145 and Air Force Office of Scientific Research (AFOSR) under a MURI grant.

Funding

Manuscript received July 31, 1997; revised October 21, 1999. This work was supported by the Office of Naval Research under Grant N00014-95-1-0872, the National Science Foundation under Grant NSF ECS 93-02145 and Air Force Office of Scientific Research (AFOSR) under a MURI grant.

FundersFunder number
National Science Foundation (NSF)NSF ECS 93-02145
Office of Naval ResearchN00014-95-1-0872
Air Force Office of Scientific Research, United States Air Force
Multidisciplinary University Research Initiative

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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