TY - JOUR
T1 - Improved composite-pattern structured-light profilometry by means of postprocessing
AU - Guan, Chun
AU - Hassebrook, Laurence G.
AU - Lau, Daniel L.
AU - Yalla, Veeraganesh G.
AU - Casey, Charles J.
PY - 2008
Y1 - 2008
N2 - Structured-light illumination (SLI) means projecting a series of structured or striped patterns from a projector onto an object and then using a camera, placed at an angle from the projector, to record the target's 3-D shape. For multiplexing these structured patterns in time, traditional SLI systems require the target object to remain still during the scanning process. Thus, the technique of composite-pattern design was introduced as a means of combining multiple SLI patterns, using principles of frequency modulation, into a single pattern that can be continuously projected and from which 3-D surface can be reconstructed from a single image, thereby enabling the recording of 3-D video. But the associated process of modulation and demodulation is limited by the spatial bandwidth of the projector-camera pair, which introduces distortion near surface or albedo discontinuities. Therefore, this paper introduces a postprocessing step to refine the reconstructed depth surface. Simulated experiments show an 78% reduction in depth error.
AB - Structured-light illumination (SLI) means projecting a series of structured or striped patterns from a projector onto an object and then using a camera, placed at an angle from the projector, to record the target's 3-D shape. For multiplexing these structured patterns in time, traditional SLI systems require the target object to remain still during the scanning process. Thus, the technique of composite-pattern design was introduced as a means of combining multiple SLI patterns, using principles of frequency modulation, into a single pattern that can be continuously projected and from which 3-D surface can be reconstructed from a single image, thereby enabling the recording of 3-D video. But the associated process of modulation and demodulation is limited by the spatial bandwidth of the projector-camera pair, which introduces distortion near surface or albedo discontinuities. Therefore, this paper introduces a postprocessing step to refine the reconstructed depth surface. Simulated experiments show an 78% reduction in depth error.
KW - 3-D imaging
KW - Structured-light illumination
KW - Surface measurements
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U2 - 10.1117/1.2981559
DO - 10.1117/1.2981559
M3 - Article
AN - SCOPUS:80455123794
SN - 0091-3286
VL - 47
JO - Optical Engineering
JF - Optical Engineering
IS - 9
M1 - 097203
ER -