Influence of Os-Ru coating on closed-space diode tests of M-Type dispenser cathodes

P. Swartzentruber, T. J. Balk, S. Roberts

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Life testing of M-Type dispenser cathodes was performed for 1000 hours to help quantify the performance enhancement due to different osmium-ruthenium (Os-Ru) thin film microstructures. Os-Ru film microstructures were selected based on their potential to inhibit tungsten/Os-Ru interdiffusion as identified in previous studies. The results show that the 10W substrate biased 150nm thick film yielded a very stable knee temperature throughout its life. However, the knee temperature was high in comparison to the standard Semicon film.

Original languageEnglish
Title of host publication2011 IEEE International Vacuum Electronics Conference, IVEC-2011
Pages401-402
Number of pages2
DOIs
StatePublished - 2011
Event2011 IEEE International Vacuum Electronics Conference, IVEC-2011 - Bangalore, India
Duration: Feb 21 2011Feb 24 2011

Publication series

Name2011 IEEE International Vacuum Electronics Conference, IVEC-2011

Conference

Conference2011 IEEE International Vacuum Electronics Conference, IVEC-2011
Country/TerritoryIndia
CityBangalore
Period2/21/112/24/11

Keywords

  • M-coating
  • M-type
  • dispenser cathode
  • knee temperature
  • microstructure
  • osmium
  • ruthenium
  • thin film

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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